Add a method to acm_random.h to generate ranges of values
Add a way to call that method to buffer.h
Adjust dct_[partial_]test.cc to use it.
Change-Id: I8c23ae9d27612c28f050b0e44c41cb4ad2494086
vpx_idct32x32_1024_add_ssse3() is actually a sse2 function and faster
than vpx_idct32x32_1024_add_sse2(). Replace the slow one. All are
code relocations, no new code.
Change-Id: I5dac0e98cc411a4ce05660406921118986638d19
'in' is used for the reference fdct. 'coeff' is input to the idct being
tested and 'dst[16]' is output
Fixes a segfault on unaligned memory access on x86.
Change-Id: I3691b1380ed49986897dd89a63ce63a80a0e0962
this was deleted in:
98967645a Remove vpx_idct8x8_64_add_ssse3()
but this was merged in:
9e03eedf6 Merge changes Ib26dd515,Ie60dabc3
after:
a92991133 Merge "dct tests: run all possible sizes in one test"
which added a new reference
Change-Id: I8da4a6c80d27b237a378ff15eead1daab89e7e25
Modify fdct4x4_test.cc to support all size combinations. This does not
add any new tests and in fact fails a few. There were minimal changes
made to the tests so it's not entirely surprising that some of the
larger 12 bit transforms are failing since it was initially only used
for 4x4.
In follow up patches the tests in fdct8x8_test.cc, dct16x16_test.cc and
dct32x32_test.cc will be evaluated and moved to dct_test.cc.
BUG=webm:1424
Change-Id: I72a23430f457d7fae8c91e706adc0e77c25abc8f
