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108 lines
3.1 KiB
C
108 lines
3.1 KiB
C
/*
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* Copyright © 2015 Guillem Jover <guillem@hadrons.org>
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*
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* Redistribution and use in source and binary forms, with or without
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* modification, are permitted provided that the following conditions
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* are met:
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* 1. Redistributions of source code must retain the above copyright
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* notice, this list of conditions and the following disclaimer.
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* 2. Redistributions in binary form must reproduce the above copyright
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* notice, this list of conditions and the following disclaimer in the
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* documentation and/or other materials provided with the distribution.
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* 3. The name of the author may not be used to endorse or promote products
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* derived from this software without specific prior written permission.
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*
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* THIS SOFTWARE IS PROVIDED ``AS IS'' AND ANY EXPRESS OR IMPLIED WARRANTIES,
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* INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY
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* AND FITNESS FOR A PARTICULAR PURPOSE ARE DISCLAIMED. IN NO EVENT SHALL
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* THE AUTHOR BE LIABLE FOR ANY DIRECT, INDIRECT, INCIDENTAL, SPECIAL,
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* EXEMPLARY, OR CONSEQUENTIAL DAMAGES (INCLUDING, BUT NOT LIMITED TO,
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* PROCUREMENT OF SUBSTITUTE GOODS OR SERVICES; LOSS OF USE, DATA, OR PROFITS;
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* OR BUSINESS INTERRUPTION) HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY,
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* WHETHER IN CONTRACT, STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR
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* OTHERWISE) ARISING IN ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF
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* ADVISED OF THE POSSIBILITY OF SUCH DAMAGE.
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*/
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#include <assert.h>
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#include <stdlib.h>
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#include <testu01/gdef.h>
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#include <testu01/unif01.h>
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#include <testu01/swrite.h>
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#include <testu01/bbattery.h>
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#define TEST_OK 0
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#define TEST_SKIP 77
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#define TEST_DIE 99
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#define test_print(msg, ...) \
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printf("TEST: " msg "\n", __VA_ARGS__)
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#define test_res(idx, name, pval, action) \
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test_print("[%4d] (%s) pVal[%d] = %f -> %s", \
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idx, name[idx], i, pval[idx], action)
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static int test_failed = 0;
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static void
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test_battery_result(void)
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{
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char **testNames = bbattery_TestNames;
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double *pVal = bbattery_pVal;
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double pSuspect = 0.001;
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test_print("bbattery_NTests = %d", bbattery_NTests);
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for (int i = 0; i < bbattery_NTests; i++) {
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/* That test was not done: pVal = -1. */
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if (pVal[i] < 0.0) {
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test_res(i, testNames, pVal, "SKIP");
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continue;
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}
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/* That test passed or failed. */
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if ((pVal[i] >= pSuspect) &&
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(pVal[i] <= 1.0 - pSuspect)) {
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test_res(i, testNames, pVal, "PASS");
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} else {
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test_res(i, testNames, pVal, "FAIL");
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test_failed++;
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}
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}
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}
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int
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main(int argc, char **argv)
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{
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unif01_Gen *gen;
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int rc;
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gen = unif01_CreateExternGenBits("arc4random", arc4random);
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/* XXX: The following battery does not set pVal, so we cannot check
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* the results. */
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bbattery_FIPS_140_2(gen);
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/* XXX: The following battery fails one test. */
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bbattery_pseudoDIEHARD(gen);
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test_battery_result();
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bbattery_Rabbit(gen, 33554432);
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test_battery_result();
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bbattery_SmallCrush(gen);
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test_battery_result();
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unif01_DeleteExternGenBits(gen);
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if (test_failed) {
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test_print("failed tests = %d", test_failed);
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/* XXX: We should probably FAIL the test, but we currently
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* have one test always failing. */
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rc = TEST_SKIP;
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} else {
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rc = TEST_OK;
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}
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return rc;
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}
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