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ec: Change gf_mad_test to use multi-binary function

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Change-Id: Ibe484239b75514b5563dd043bb0e8c46d3bdac5e
Signed-off-by: Greg Tucker <greg.b.tucker@intel.com>
This commit is contained in:
Greg Tucker 2018-10-05 17:48:02 -07:00
parent 4832ace5f2
commit 09e787231b
1 changed files with 4 additions and 10 deletions
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14
erasure_code/gf_vect_mad_test.c
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@ -34,20 +34,14 @@
#include "types.h"
#ifndef ALIGN_SIZE
# define ALIGN_SIZE 16
# define ALIGN_SIZE 32
#endif
#ifndef FUNCTION_UNDER_TEST
#if __x86_64__ || __i386__ || _M_X64 || _M_IX86
//By default, test sse version
# define FUNCTION_UNDER_TEST gf_6vect_mad_sse
# define REF_FUNCTION gf_6vect_dot_prod_sse
# define VECT 6
#else
# define FUNCTION_UNDER_TEST gf_vect_mad_base
# define REF_FUNCTION gf_vect_dot_prod_base
//By default, test multi-binary version
# define FUNCTION_UNDER_TEST gf_vect_mad
# define REF_FUNCTION gf_vect_dot_prod
# define VECT 1
#endif //__x86_64__ || __i386__ || _M_X64 || _M_IX86
#endif
#ifndef TEST_MIN_SIZE